This was so helpful thank you so much. We have the Alpha 300RA and I didn't know how to properly use the True surface feature. Will try on our samples and see if I will manage
@binghan-e3v3 ай бұрын
b( ̄▽ ̄)d
@andymouse4 ай бұрын
Nah, sample thread could introduce a trapped volume.
@ronrouyer20694 ай бұрын
Can you record the sample thru a given time period and how does this machine compare to the U of A new electron microscope?
@EyringMaterialsCenter4 ай бұрын
if your question is about whether we can record "movies," the answer is yes. The new microscope at UofA is the Hitachi HF5000 - 200KeV aberration-corrected TEM, right? So, the only similarity is that both machines are probe-corrected STEM. The rest, from the manufacturer, are entirely different regarding stability, working voltages, EDS, and EELS capabilities. If you have more questions, please contact me at [email protected]. Thanks.
@VINAYSAINI7 ай бұрын
Hi how we can process the data on open free source software for this instruments
@dhonnyavvianz43319 ай бұрын
where is the thickness value of the film from the data analysis?
@mirib266011 ай бұрын
amazing video, thank you so much really
@zekiadam Жыл бұрын
Thanks very good
@rayshen9739 Жыл бұрын
Do u know ABF ?
@marolgu Жыл бұрын
Hi, thanks for the visit and question. And yes, ABF is available at this equipment at ASU. Thanks.
@rayshen9739 Жыл бұрын
@@marolgu Do you use beam stopper and STEM aperture 3mm to act as ABF?
@DaiMingTang Жыл бұрын
Crystally clear explanations. Thank you!
@mahmoudsorour2028 Жыл бұрын
Thanks for the video! When you were measuring the reflectance, what is there in the 2 holders you are refering to as the reference and the sample? What is the chemical composition on them? Also, is it not necessary to run any baseline scan for this reflectance mode? Does it not have anything to do with the BaSO4 baseline?
@EyringMaterialsCenter Жыл бұрын
We use a spectralon 99% reference on our instrument. Spectralon are calibrated references made of teflon. I have not used BaSO4 for baseline. If you are interested I see an interesting comparizon between references here: www.shimadzu.com/an/sites/shimadzu.com.an/files/pim/pim_document_file/applications/application_note/13902/a639_e.pdf
@mahmoudsorour2028 Жыл бұрын
@@EyringMaterialsCenter Thank you very much. Have a nice day
@TheMiminad2 жыл бұрын
Thank you! Great video!
@qingguobai57752 жыл бұрын
HELPFUL and INSTRUCTIVE!
@CherryWang1592 жыл бұрын
Why I can't find the integral gain and the proportional gain parameter ? (I use the mechanical properties mode)
@EyringMaterialsCenter2 жыл бұрын
Hi. If you are using Any Peak Force mode, the gains are being set automatically as you scan. In tapping mode they will appear on the Scan Parameters list of values to change.
@CherryWang1592 жыл бұрын
@@EyringMaterialsCenter Thank you so much. 😃
@darylldalayoan48802 жыл бұрын
I would like to ask, is there any need to change the drive amplitude and amplitude set point when using tapping mode? I am quite new to AFM. I normally change these parameters but cannot seem to get consistent images most of the time. This is the first guide I've seen in which these parameters were not changed.
@EyringMaterialsCenter2 жыл бұрын
Typically, you can set it and forget it! When using tapping mode, the setpoint can be decreased on samples that require greater tapping force. If your probe is tending to come off the sample surface, you should increase the tapping force. Also, make sure you're using the best probe for the sample.
@darylldalayoan48802 жыл бұрын
@@EyringMaterialsCenter So Ideally, I can match the trace and retrace by changing the proportional and integral gains as pointed out in the video?
@EyringMaterialsCenter2 жыл бұрын
@@darylldalayoan4880 yes that is the goal to get good images.
@infinitesolutions26022 жыл бұрын
Alhamdulillah
@Sandeep-xm1zt3 жыл бұрын
Do we need to enter the value of omega offset in the Sample offsets field under User Settings tab before starting the gonio scan?
@EyringMaterialsCenter3 жыл бұрын
Hi Sandeep, unless the offset is large I would not worry about entering a sample offset.
@faheemwani19963 жыл бұрын
sir how to calculate lattice parameter of composite film Polyvinyl Achohol (PVA)-LaFeO3 with different concentrations
@shirinmohammadian92193 жыл бұрын
What are the dimensions of the container for the aerosol sample?
@shizeyang3 жыл бұрын
The standard TEM grid has a size of 3 mm in diameter.
@shirinmohammadian92193 жыл бұрын
How long does it take to take a photo with an ETEM microscope? What if it is an aerosol sample? How to prepare an aerosol sample? How do you get an aerosol sample into a cell?
@shizeyang3 жыл бұрын
Many thanks for your questions. Sample preparation is an important part of the microscopy experiments. 1. How long does it take to take a photo with an ETEM microscope? With you sample on a TEM grid, a photo can be taken within half an hour for sample loading and basic equipment check up. Then a single image only takes a few minutes to collect and record. 2. What if it is an aerosol sample? There is not much difference as long as your sample is on a standard TEM grid. 3. How to prepare an aerosol sample? Aerosol sample has to be collected in some way, say, on a filter paper. Then the sample can be moved from the filter paper to a TEM grid. You should search literature to find out the best procedure for this. 4. How do you get an aerosol sample into a cell? I am not quite sure about the "cell" you are talking about. You can send me an email to discuss about details.
@75rock473 жыл бұрын
Thanks for this video. It helped me a lot. I would also like to see training videos on Witech AFM and Confocal microscopy.
@amrmahmoud72313 жыл бұрын
Great, thanks
@manojdhiman56943 жыл бұрын
As per you the system without ATR can solve the problem of checking transmission of germanium,silicon window.
@EyringMaterialsCenter3 жыл бұрын
All you would need to do is place the window in the beam path during the measurement. No special accessory is needed.
@manojdhiman56943 жыл бұрын
is ATR necessary for checking of transmission of germanium or silicon window?
@EyringMaterialsCenter3 жыл бұрын
It is not recommended. A straight-through transmission if preferred. The ATR would only provide information about the surface of the material being analyzed.
@manojdhiman56943 жыл бұрын
Thankyou
@manojdhiman56944 жыл бұрын
how we check the transmissiin of ir coatrd windows made of germanium , silicon,etc
@EyringMaterialsCenter4 жыл бұрын
Hi Manan, assuming the window is transparent enough, which should be the case, you can do a straight through measurement by mounting the window on the steel holder shown around 1:33 on the video. You can use tape to mount the sample as long as the beam does not go through the tape.
@manojdhiman56944 жыл бұрын
@@EyringMaterialsCenter is ATR required for this?
@EyringMaterialsCenter4 жыл бұрын
@@manojdhiman5694 I would not use the ATR for it unless you are only interested in analyzing the coating.
@ammai_kollo4 жыл бұрын
Good topics
@soogy2senk4 жыл бұрын
Kindly upload a alignment video
@YYJung-dc6wt4 жыл бұрын
SEC Tabletop SEM SNE 4500 Series are most functionalized and high resolution mode in tabletop series. 5nm Resolution and 150.000 X Actual Magnification and strong at outside vibration factors. It is a easiest operation and multi user adaptable models in Tabletop SEM. #SEc Europe #Tabletopsem #www.tabletopsem.com
@soogy2senk4 жыл бұрын
How to align the device, one video tutorial please
@harouacheali27144 жыл бұрын
thank you very much
@nanotechdigital52094 жыл бұрын
It is a great video training . ^^ We are SEC Europe Head Office. -tabletopsem -Tischrem - Nanotech digital GmbH (SEC Europe) www.nanotechdigitalgmbh.com
@zahidurrahaman4284 жыл бұрын
Thanks a lot for this helpful video. Keep up the good work.
@romanazady78914 жыл бұрын
Hello, how can I get User name and password for Perkinelmer. I already used administrator but it's not working
@EyringMaterialsCenter4 жыл бұрын
Hi Roman, The system owner should have access to doing that. Otherwise, I would suggest contacting PerkinElmer's customer service. Good luck!
@yeongjia84 жыл бұрын
Hello, could you make a video on data analysis on emissions/how to read on the Spectrum software? Thanks
@EyringMaterialsCenter4 жыл бұрын
Hi, Thank you for your interest. The proposed video is not currently on our list but it is an excellent idea and I will definitely keep it in mind for future videos.
@parthodas42194 жыл бұрын
This is really helpful. Do you have any tips that can be followed to focus the instrument? I face hard time when i start that focus step. Thanks.
@dianaconvey45274 жыл бұрын
Hi Partho, It is always a good idea to check where the laser spot is in relation to the white light coming from the camera before you insert your sample or probe. Using a white strip of paper, place it in the optical head just above the probe holder. It should be just to the left of or near center. The white light is your general field of view, FOV, when observing the live image on the software "Setup" screen. If you insert a very reflective sample, such as a smooth metal like gold, you can then direct the laser spot to the end of your cantilever. Make certain your probe is in the FOV, then focus on the reflective sample. Sometimes bringing the probe close to the surface of the sample will help in seeing the laser spot. Then watch the SUM. It should increase as the reflection of the laser hits the position sensitive detector. If you continue to have issues, feel free to connect with me on Zoom. I will be happy to walk you through the process. Best regards, Diana
@parthodas42194 жыл бұрын
@@dianaconvey4527 Thank You very much !
@thomasizdebski36664 жыл бұрын
Great explanation and very straightforward!
@thauthentic4 жыл бұрын
Nice. Very useful
@fatimaezzahrachakik56755 жыл бұрын
please how to determine the crystal structure of the sample from High Score?
@luthfiyahrachmawati14736 жыл бұрын
Hi, thank you for your nice video, it's very helpful. I just wanna ask , if I wanna take blank sample (ITO glass) so where is the place for blank sample?
@dianaconvey45276 жыл бұрын
Luthfiyah, if I understand you correctly, I believe you are asking where to put a reference sample. The reference port is located on the front side of the integrating sphere. In the video you might notice there is a reference standard used on that port when a reference sample is not used. I hope this answers your question. ~Diana
@neethuemmanuel78996 жыл бұрын
Hi, is it possible to measure the absolute optical power or intensity of the light falling on the sample in Lambda 950,?.
@EyringMaterialsCenter6 жыл бұрын
Hi Neethu, The system is a dual beam instrument comparing the intensity between the 2 beams so there is no absolute measurement of the intensity only a relative one.
@jakefl0wers6 жыл бұрын
Strain and size analysis?
@dianaconvey45276 жыл бұрын
Odebowale I suggest checking out the information at J.A. Woollam's website. They have a very nice tutorial and offer classes on data analysis. Good luck
@odebowalealade92486 жыл бұрын
reaally enjoy the video. can you please send me reference material on WVASE Ellipsometry dataanalysis
@stellauget186 жыл бұрын
im having having a hard time to interpret the results i got from XRD analysis. Please any help!
@rehanabibi31717 жыл бұрын
Hi Sir a useful video but i face some problems in my High plus software before i used it for many analysis but now as i did all of the step finally after selecting the target elements in the periodic table and click search so a message appear that no candidate found so plz tell me that what i should do, i reinstall but still not ok.
@EyringMaterialsCenter7 жыл бұрын
I see that you saw my response below. You might need to contact PANalytical for help they have excellent customer service.
@kamal_abedin7 жыл бұрын
how much is it ?
@EyringMaterialsCenter7 жыл бұрын
I do not have the current price. Please contact the PANalytical sales office for pricing information.
@kamal_abedin7 жыл бұрын
how much was it ?
@hastivahidi65187 жыл бұрын
Hi, how are u? when I choose some possible elements and click search, I get this message: No candidates found. What is the problem?
@EyringMaterialsCenter7 жыл бұрын
The issure can be a number of things. Make sure you have the PDF database on the computer you are using. If you are unsure of the elements present make sure they are selected in grey rather than green.
@rehanabibi31717 жыл бұрын
hi hasti have you solve the problem? i have the same problem as yours? by using the software ?
@hastivahidi65187 жыл бұрын
Hi thanks for your answer. I still have the same problem. I have PDF file on the the computer and I have imported them correctly because I can see the number of patterns which is a big one. but I still receive the same msg although I am sure about my the elements I chose
@hastivahidi65187 жыл бұрын
Hi how are u? I still have this problem:( did u find anything to solve it? let me know please and I will let you know too thanks
@nareshsarkar56467 жыл бұрын
how to download this software, i am searched it so many time in google but it is not available trial version also.. kindly help me... my email id is [email protected]
@EyringMaterialsCenter7 жыл бұрын
Hi Naresh, Please contact PANalytical, this program is sold by them.
@harryssamosir10948 жыл бұрын
how to download PANalytical X'Pert HighScore Plus? thanks
@EyringMaterialsCenter8 жыл бұрын
HighScore Plus must be purchased from PANalytical.