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Spoiled grain represents a huge pool of potential food that could help feed a growing global population. Researchers from the University of Manitoba used the CLS to peer inside the grains of different varieties of hard durum wheat, to identify signs of spoilage and resistance. The synchrotron enabled them to study not only the external markers of spoilage, but also internal changes in structure and nutritional value. Their work will help plant breeders develop better varieties that resist spoilage and maintain nutritional content longer, and help guide farmers and storage managers maintain the longevity of harvested wheat.
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