Introduction to electron backscatter diffraction (EBSD)

While electron backscatter diffraction (EBSD) was discovered in 1928 by Kikuchi, it wasn’t until the full automation of the technique in 1991 that the technique’s utility for characterizing microstructure was truly realized. EBSD is a scanning electron microscopy (SEM)-based technique that provides a practical means of quantifying and visualizing the crystallographic aspects of a polycrystalline material’s microstructure on a point-specific basis. EBSD systems are now found on SEMs in materials characterization labs worldwide. This webinar will introduce the EBSD technique, including a discussion on the interplay between diffraction physics and crystallography. This will be followed by an introduction to EBSD applications in materials science, engineering, and the earth sciences.