The Cryogenic Wafer Prober

The Cryogenic Wafer Prober, released in 2019, is developed to make automatic wafer probing at cryogenic temperatures well below 4 K possible. We have combined our expertise of building cryogen-free cryogenic systems with a neighboring company Afore, who has long experience in building automated wafer level test systems. Together we created the Cryogenic Wafer Prober. This tool allows up to 100 times faster throughput in sample characterization and we foresee that it will dramatically help speeding up the developments of cryogenic quantum devices, electronics and detectors.
For technical specifications, visit: bit.ly/38SNaxR
To see the probing process, check out this other video: • The Cryogenic Wafer Pr...
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