Introduction to VFA+

The next era of fast, noncontact, high-resolution 3D metrology of aspheric optics is here! VFA+ pushes the boundaries of what is possible in the design and production of precise aspheric surfaces. The VFA+ leverages the benefits of Fizeau interferometry through a unique combination of precise, high-resolution, fast, and full aperture metrology for axisymmetric aspheres. This allows faster convergence on deterministic polishing feedback for more efficient surface generation.