GBK0050 Assignment

1. OOI QIAN KEN 24005955/1
2. RACHEL GAN WEI QING 24004805/1
3. AHMAD HARITH IKHWAN BIN ABD WAHID 23001305/2
Video Summary: 1. OOI QIAN KEN 24005955/1
2. RACHEL GAN WEI QING 24004805
3. AHMAD HARITH IKHWAN BIN ABD WAHID 23001305/2
Video Summary:
In this insightful interview, Pedram Tabatabaeemoshiri discusses his research on defect detection in semiconductor wafers. He highlights how his work addresses critical challenges in improving the quality and reliability of semiconductors, which are essential for modern technologies like smartphones, AI systems, and advanced computing. Pedram explains common wafer defects, such as particle contamination and surface dislocations, and their impact on device performance.
He describes traditional defect detection methods like optical inspection and electron microscopy, emphasizing their limitations in accuracy and scalability. Pedram underscores the transformative role of machine learning and AI, which enable more precise, efficient, and automated defect detection processes.
Looking to the future, he expresses confidence that his research can significantly benefit the manufacturing sector, enhancing productivity and global competitiveness. Pedram highlights the importance of innovation and collaboration to meet the evolving demands of the semiconductor industry.
Researcher name: Pedram Tabatabaeemoshiri
Email: [e-mail]
Affiliation: University Malaya, Semiconductor manufacturing and Design Company (company name prefer not to say)
Researcher name: Pedram Tabatabaeemoshiri
Email: [e-mail]
Affiliation: University Malaya, Semiconductor manufacturing and Design Company (company name prefer not to say)