JTAG Embedded Test (JET) - Corelis On-demand Webinar on ScanExpress, At Speed Functional Testing

ABOUT THE WEBINAR
Functional circuit board testing presents many challenges that are often costly and time-consuming. From automotive ADAS to aerospace avionics systems, embedded system functional tests are necessary to ensure product quality, but creating these tests can take resources away from teams that are already stretched thin. Operating system diagnostics tend to be limited and focused on software errors rather than possible hardware defects.
In this webinar, learn how Corelis software solution, ScanExpress JET can reduce test development time and improve embedded test diagnostics by automating the functional test generation process on CPU-based IEEE-1149.x, compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
Content Agenda
Introduction
Corelis Overview and History
What is ScanExpress JET?
Features and Benefits of ScanExpress JET
Methodology
Supported Processors
Hardware Interface Devices
Live Q & A
by Bob Deibner
Senior Applications Engineer
Corelis Inc.
Bob has been with Corelis for over 14 years and has a BSEE from the University of California, Irvine. He has a deep understanding and experience in IEEE Boundary-scan test standards, as well as Corelis products, and services. Bob has a passion for educating and training, leading Corelis training classes at customer on-site locations, online webinars, and on-site at Corelis headquarters in Cerritos, California.
Download Whitepaper on Enhancing Boundary-Scan with JTAG Embedded Test: www.corelis.co...