AFM | Enhancing Traditional Electron Microscopy Applications | Bruker

This webinar takes a look at recent AFM technical advances that provide a highly productive nano-imaging workflow, akin to current electron microscopy based techniques. Improvements in speed, productivity/usability, and materials characterization are opening new possibilities for research topics, samples, and work environments. We will review and compare a range of applications where the AFM offers either complementary information, or a potentially easier path to research results.
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