How to prepare FIB samples for in situ TEM

This workflow explains the procedure for preparing FIB samples onto a MEMS-based E-chip for in situ TEM. FIB sample preparation can be used to prepare a wide variety of materials for TEM or in situ TEM analysis and is a relatively simple technique to learn. For more information, tips and tricks, and sample preparation guides, visit our library of content at www.protochips.com

[@kk3074]

Beautiful presentation

[@samafari8168]

Can this method be used for Poseidon select liquid experiments?

[@kpfing644]

Could you please share the information about this FIB model? Thanks!

[@miguelfernandosilvacastron3279]

How can I learn more about this?

[@abhishekekatpure4563]

Nice

[@skjamaluddin3622]

How can I use this method if my tip is coming from back side of sem column? In your case it is coming exactly parallel to ion column.

[@someoneelse1534]

I don't know what they're making, but boy is my mind blown

[@CyrusTabery]

0:32 is a thing of beauty. Control of atoms at the nm scale is the key to unlocking ai and peace

[@CyrusTabery]

How does the audio not include “yoink” at 1:39?

[@qweqqerq]

0p009[⁰0,0😊😊00z😊​@@CyrusTabery

[@heroesneverdie6947]

شنو هاي الكلاوات 😂

[@kek_9]

what the f.. :o