So nice of you. For more such videos, stay tune the channel.
@ajiths16893 жыл бұрын
very nice video and lecture
@sujendramanik50683 жыл бұрын
Very Help full, Thank you.
@TeamVLSI3 жыл бұрын
You're welcome Sujendra!
@asmisharma31635 жыл бұрын
Thank you so much for these videos. Extremely helpful. Also, please share the Physical verification concepts (perhaps a series, like the one with the file formats you have shared). Thank you so much.
@TeamVLSI5 жыл бұрын
Thanks a lot Asmi. Said series is already in my bucket, will be shared soon.
@abishekguggari11804 жыл бұрын
excellent information.really helpful.keep it up.thank u
@TeamVLSI4 жыл бұрын
Thanks abishek!
@yennarascalamindit26324 жыл бұрын
Thank you for this video. Was really helpful.
@TeamVLSI4 жыл бұрын
Welcome Yenna! Glad it was helpful! Stay connected and keep learning...
@Jamboreeni4 ай бұрын
Can you please explain how reducing wire length will help in EM?
@Jamboreeni4 ай бұрын
Sorry got it, Blech length
@NomadMaveric4 жыл бұрын
Thanks Sir. The tutorials are very helpful.
@TeamVLSI4 жыл бұрын
Thanks @Praphulla !
@mattoomueen4 жыл бұрын
Thank you. It's really helpful. Cheers!
@TeamVLSI4 жыл бұрын
Welcome Mueen! It's our pleasure. :)
@ArunKumar-wu4px4 жыл бұрын
Awesome Explanation ...what about the EM tool used in ICC and Mentor Graphics..in which stage we will check electromigration...
@LAFAMA57594 жыл бұрын
Great Job!
@TeamVLSI4 жыл бұрын
Thanks @Fernando !
@vinodk81254 жыл бұрын
Thank you..its really helpful. Can you explain the difference between EM, ESD & Antenna effect ?? Which stage we can see these effects while doing the manufacturing ??
@TeamVLSI4 жыл бұрын
Thanks Vinod. I have noted your request, will try to cover in future.
@darpankumar94993 жыл бұрын
Thank you sir for these videos ... I have one question related to EM, in which nets EM take place...
@maltikumari86774 жыл бұрын
Thanks for uploading..
@TeamVLSI4 жыл бұрын
Welcome @Malti Keep encouraging us!!
@vinodkumarck19194 жыл бұрын
Good work 👏👏
@TeamVLSI4 жыл бұрын
Thank you so much @Vinod 😀
@vinodkumarck19194 жыл бұрын
@@TeamVLSI Hi, can you explain how reducing frequency will reduce EM.
@asyameliksetyan12832 жыл бұрын
Thank you too.
@TeamVLSI2 жыл бұрын
Welcome Asya, Keep learning!
@trivenik92194 жыл бұрын
What is the command to check EM IR in icc2 can you please help me
@AngelPl4y3r4 жыл бұрын
This video is amazing and you do a great job at explaining the problem and how the industry have dealt with it, specially on how its a process dependent problem to a great extent but how the design side of things can contribute to mitigate the problem. THANKS!
@TeamVLSI4 жыл бұрын
You are welcome.
@akhilalla32474 жыл бұрын
you mentioned out of 5 chips 1 chip is getting failed due to EM? for suppose, i have one plus phone with Snapdragon chip like wise i have 5 mobiles, In this as you told, remaining four are working properly why only one is having this issue(I mean all has to face this issue why only is facing this issue) and also you told this issue will come even after years, how does current increases in the chip after using for years? i mean suppose till 5 years i have used the mobile there is no problem upto 5 years. but suddenly how current in the metal gets increased? i fabricated as per design rules and it worked for 5 years only. how come the current in the chip is within the limit for 5 years? how current suddenly increasing in the design? please clear my doubt sir Thank you for all your videos. it's really helpful to gain more knowledge on this concepts. I started reading your blogs also. great knowledge sir.
@TeamVLSI4 жыл бұрын
Thanks Akhil to writing your doubts is such a clear way. You could also use timestamp of video to indicate the point on which respect you have doubt. I did not got the first part of question. In second part explanation is like that. "A chip may face EM issue after some times" is valid and it is not related to increase of current. the movement of atom is due to moment transfer might be very slow and its effect will come after some years. Although there is reliability test of chip for this, in which we can predict the characteristics of chip after few years. Another thing is there is aging effect in transistors which affect the performance of a chip, that is related to current of transistors. So fact is that the current of transistors at the time of fabrication is not going to be same after 10 years later. Thanks.
@akhilalla32474 жыл бұрын
@@TeamVLSI Thank you for the info sir
@sharathseshadri36348 ай бұрын
Keep length short ???
@csst293 жыл бұрын
what is F wind?
@gokulapriya49844 жыл бұрын
Please do share remaining issue...of the following...in this video
@TeamVLSI4 жыл бұрын
Sure Gokula, It will be published soon.
@gokulapriya49844 жыл бұрын
And also share a scripts file.... Like floorplan.tcl,pace.tcl,route.tcl,mmmc,tcl....
@TeamVLSI4 жыл бұрын
You can check now, this series has completed now.
@gokulapriya49844 жыл бұрын
Thank you so much!!
@komatinenibharathkumar82914 жыл бұрын
thank you so much for yur information. Can u please upload more problems regarding EM?
@jyothico88123 жыл бұрын
Very nice and detailed teaching. Could you please clear my doubt how is reducing buffer size in clock lines taking care of EM? Thank you
@TeamVLSI3 жыл бұрын
Higher the drive strength of buffer, will require more current... more susceptible to EM.
@huhuu-mq1tx9 ай бұрын
@@TeamVLSI im confused, i thought if the area is bigger, current density will be lower, thus can avoid EM. pls explain... if we upsize a cell, wouldn't it help EM?
@wilsonhung43699 ай бұрын
@@huhuu-mq1tx I think what matters is the wire, where EM takes place, but not the buffer. So larger buffer causes more current for the wires connected to it and thus more EM risks.